Center for Electron Microscopy (CEM) in Tianjin University of Technology (TUT) was founded in 2015. CEM focuses on characterizing atomic structures and chemical information of surfaces and interiors of materials and their evolutions during active services at atomic resolution (AR) by combining aberration-corrected (AC) electron microscopy, AR spectroscopies, characterization of interatomic electric fields, tomography of structural information, in-situ electron microscopy and so on. These capabilities can reveal the origins of the properties of materials and give scientific guides for designing new high-performance materials. CEM has 3 transmission electron microscopes (including one with a probe corrector and the newest model of Titan Cubed Themis G2 300, one Talos F200X and one Tecnai G2 Spirit TWIN), 1 dual-beam instrument with focused-ion beam and electron beam (Helios NanoLab 460HP), and 2 scanning electron microscopes (Verios 460L and Quanta FEG 250). CEM has a core staff of 13, including 1 Fellow of Royal Society of Chemistry, 2 lecturers, 2 postdoctoral researchers, 6 engineers and 1 assistant to the director.